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Total-ionizing-dose effects in modern CMOS technologies
Hugh Barnaby
Solid State Electronics Research Center (CSSER)
Electrical Engineering
Connection One (C1)
Research output
:
Contribution to journal
›
Article
›
peer-review
527
Scopus citations
Overview
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Physics & Astronomy
CMOS
95%
ionizing radiation
73%
dosage
70%
radiation dosage
42%
radiation effects
39%
radiation
38%
industries
29%
hardness
27%
scaling
24%
Engineering & Materials Science
Ionizing radiation
100%
Semiconductor materials
62%
Radiation
56%
Radiation effects
46%
Hardness
27%
Industry
15%