Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography

Carl R. Mayer, Jon Molina-Aladareguia, Nikhilesh Chawla

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Al-SiC nanolaminate composites show promise as high performance coating materials due to their combination of strength and toughness. Although a significant amount of modeling effort has been focused on materials with an idealized flat nanostructure, experimentally these materials exhibit complex undulating layer geometries. This work utilizes FIB tomography to characterize this nanostructure in 3D and finite element modeling to determine the effect that this complex structure has on the mechanical behavior of these materials. A sufficiently large volume was characterized such that a 1 × 2 μm micropillar could be generated from the dataset and compared directly to experimental results. The mechanical response from this nanostructure was then compared to pillar models using simplified structures with perfectly flat layers, layers with sinusoidal waviness, and layers with arc segment waviness. The arc segment based layer geometry showed the best agreement with the experimentally determined structure, indicating it would be the most appropriate geometry for future modeling efforts.

Original languageEnglish (US)
Pages (from-to)369-376
Number of pages8
JournalMaterials Characterization
Volume120
DOIs
StatePublished - Oct 1 2016

Fingerprint

Focused ion beams
Tomography
tomography
ion beams
Nanostructures
microstructure
Microstructure
Geometry
arcs
geometry
flat layers
toughness
Toughness
coatings
Coatings
composite materials
Composite materials

Keywords

  • FEA
  • Micropillar compression
  • Multilayer
  • Nanostructure
  • Waviness

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography. / Mayer, Carl R.; Molina-Aladareguia, Jon; Chawla, Nikhilesh.

In: Materials Characterization, Vol. 120, 01.10.2016, p. 369-376.

Research output: Contribution to journalArticle

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