Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules

Rico MEIER, F. Kraemer, S. Wiese, K. J. Wolter, J. Bagdahn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Solar module lifetime is limited by the fatigue behavior of its cell interconnectors: the copper-ribbons. Every change in temperature induces thermo-mechanical stresses in the module components due to their thermo-mechanical mismatch. The purpose of this work is to quantify this load on the copper-ribbons between the individual cells of a cell string during a thermal cycling test by measuring cell displacement using digital image correlation and to compare the results to finite element analysis (FEM). Furthermore with help of FEM the influences of different materials were investigated, allowing material and layout optimizations with respect to copper-ribbon loading.

Original languageEnglish (US)
Title of host publicationReliability of Photovoltaic Cells, Modules, Components, and Systems III
Volume7773
DOIs
StatePublished - Oct 18 2010
Externally publishedYes
EventReliability of Photovoltaic Cells, Modules, Components, and Systems III - San Diego, CA, United States
Duration: Aug 3 2010Aug 5 2010

Other

OtherReliability of Photovoltaic Cells, Modules, Components, and Systems III
CountryUnited States
CitySan Diego, CA
Period8/3/108/5/10

Fingerprint

Cycling
Thermal cycling
Copper
ribbons
modules
Crystalline materials
copper
Module
cycles
Cell
cells
Finite element method
thermal cycling tests
Finite Element
Mechanical Stress
Digital Image
Cells
Fatigue of materials
layouts
Fatigue

Keywords

  • FEM
  • Reliability
  • Ribbon
  • Thermal cycling test
  • Thermo-mechanical

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

MEIER, R., Kraemer, F., Wiese, S., Wolter, K. J., & Bagdahn, J. (2010). Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules. In Reliability of Photovoltaic Cells, Modules, Components, and Systems III (Vol. 7773). [777312] https://doi.org/10.1117/12.861350

Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules. / MEIER, Rico; Kraemer, F.; Wiese, S.; Wolter, K. J.; Bagdahn, J.

Reliability of Photovoltaic Cells, Modules, Components, and Systems III. Vol. 7773 2010. 777312.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

MEIER, R, Kraemer, F, Wiese, S, Wolter, KJ & Bagdahn, J 2010, Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules. in Reliability of Photovoltaic Cells, Modules, Components, and Systems III. vol. 7773, 777312, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, San Diego, CA, United States, 8/3/10. https://doi.org/10.1117/12.861350
MEIER R, Kraemer F, Wiese S, Wolter KJ, Bagdahn J. Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules. In Reliability of Photovoltaic Cells, Modules, Components, and Systems III. Vol. 7773. 2010. 777312 https://doi.org/10.1117/12.861350
MEIER, Rico ; Kraemer, F. ; Wiese, S. ; Wolter, K. J. ; Bagdahn, J. / Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules. Reliability of Photovoltaic Cells, Modules, Components, and Systems III. Vol. 7773 2010.
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