The structural sensitivity of electron energy-loss near-edge structure (ELNES)

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10 Scopus citations

Abstract

Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

Original languageEnglish (US)
Pages (from-to)165-172
Number of pages8
JournalUltramicroscopy
Volume18
Issue number1-4
DOIs
StatePublished - 1985

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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