The structural sensitivity of electron energy-loss near-edge structure (ELNES)

Research output: Contribution to journalArticle

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Abstract

Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

Original languageEnglish (US)
Pages (from-to)165-172
Number of pages8
JournalUltramicroscopy
Volume18
Issue number1-4
DOIs
StatePublished - 1985

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Energy dissipation
energy dissipation
electron energy
Electrons
Multiple scattering
Beryllium
Inelastic scattering
Deconvolution
Strain energy
Green's function
electron probes
beryllium
artifacts
inelastic scattering
Green's functions
Crystals
plots
sensitivity
scattering
excitation

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

The structural sensitivity of electron energy-loss near-edge structure (ELNES). / Spence, John.

In: Ultramicroscopy, Vol. 18, No. 1-4, 1985, p. 165-172.

Research output: Contribution to journalArticle

@article{fd654b3d3d8548f69837f841f73f40db,
title = "The structural sensitivity of electron energy-loss near-edge structure (ELNES)",
abstract = "Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.",
author = "John Spence",
year = "1985",
doi = "10.1016/0304-3991(85)90134-2",
language = "English (US)",
volume = "18",
pages = "165--172",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "1-4",

}

TY - JOUR

T1 - The structural sensitivity of electron energy-loss near-edge structure (ELNES)

AU - Spence, John

PY - 1985

Y1 - 1985

N2 - Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

AB - Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.

UR - http://www.scopus.com/inward/record.url?scp=0022219404&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022219404&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(85)90134-2

DO - 10.1016/0304-3991(85)90134-2

M3 - Article

AN - SCOPUS:0022219404

VL - 18

SP - 165

EP - 172

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 1-4

ER -