TY - JOUR
T1 - The structural sensitivity of electron energy-loss near-edge structure (ELNES)
AU - Spence, John
N1 - Funding Information:
I am grateful to Drs. D. Saldin and P. Durham for advice on the use of the multiple scattering programs, to Dr. C. Ahn for providing a Be foil, and to Dr. M. Disko for many things in recent years. This work was supported by ARO grant DAAG 29-83-K-0087 and the facilities of the NSF National Center for Electron Microscopy at ASU.
PY - 1985
Y1 - 1985
N2 - Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.
AB - Calculations are reported using the multiple scattering, Green function method for the transmission electron energy-loss near-edge structure (ELNES) of inner shell excitations. These reveal a high degree of sensitivity to the local crystallographic environment. A plot of the reciprocal of the ejected crystal electron wavevector for a particular feature in the ELNES against nearest-neighbor distance is found to be linear over a small range. This suggests a method for the quantitative measurement of local strain using ELNES obtained with a subnanometer electron probe. An experimental K-edge spectrum from beryllium is used to demonstrate the removal of plasmon multiple inelastic scattering artifact from ELNES by the method of logarithmic deconvolution, without adjustable parameters.
UR - http://www.scopus.com/inward/record.url?scp=0022219404&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0022219404&partnerID=8YFLogxK
U2 - 10.1016/0304-3991(85)90134-2
DO - 10.1016/0304-3991(85)90134-2
M3 - Article
AN - SCOPUS:0022219404
SN - 0304-3991
VL - 18
SP - 165
EP - 172
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - 1-4
ER -