The Reliability Analysis of High Power Switches Composed of Series and Parallel Branches

Gerald Thomas Heydt, Daniel Scott James, Esma Gel, Mihaela Marilena Albu, Norma F. Hubele

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

This paper contains an analytical method for the failure analysis of a matrix configuration of switches in series and parallel. The concept is to use lower voltage and current rating switches in series and parallel to attain the higher ratings needed in power engineering applications. The analysis is based on probability state transition. A discussion of voltage and current snubbing is given. Representative results are illustrated and applications are suggested.

Original languageEnglish (US)
Title of host publication2003 IEEE Power Engineering Society General Meeting, Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages472-479
Number of pages8
ISBN (Print)0780379896, 9780780379893
StatePublished - Jan 1 2003
Event2003 IEEE Power Engineering Society General Meeting - Toronto, Ont., Canada
Duration: Jul 13 2003Jul 17 2003

Publication series

Name2003 IEEE Power Engineering Society General Meeting, Conference Proceedings
Volume1

Other

Other2003 IEEE Power Engineering Society General Meeting
CountryCanada
CityToronto, Ont.
Period7/13/037/17/03

    Fingerprint

Keywords

  • Circuit breaker
  • Failure modes
  • Reliability
  • Switches

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Engineering(all)

Cite this

Heydt, G. T., James, D. S., Gel, E., Albu, M. M., & Hubele, N. F. (2003). The Reliability Analysis of High Power Switches Composed of Series and Parallel Branches. In 2003 IEEE Power Engineering Society General Meeting, Conference Proceedings (pp. 472-479). (2003 IEEE Power Engineering Society General Meeting, Conference Proceedings; Vol. 1). Institute of Electrical and Electronics Engineers Inc..