The effect of elastic relaxation on the local structure of lattice-modulated thin films

J. M. Gibson, Michael Treacy

Research output: Contribution to journalArticle

55 Citations (Scopus)

Abstract

Shear stresses in lattice-modulated bulk materials, such as spinodally decomposed alloys, distort considerably the local unit cell dimensions. We show that the distortion changes appreciably in thin films because of elastic relaxation near the surfaces, giving rise to a significant thickness dependence to this effect. It is emphasized that these distortions can be large and must be allowed for if high resolution electron microscopy is to be used as a technique for deducing local composition or unit cell dimensions in composition-modulated materials.

Original languageEnglish (US)
Pages (from-to)345-349
Number of pages5
JournalUltramicroscopy
Volume14
Issue number4
DOIs
StatePublished - 1984
Externally publishedYes

Fingerprint

Thin films
High resolution electron microscopy
thin films
cells
Chemical analysis
shear stress
Shear stress
electron microscopy
high resolution

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

The effect of elastic relaxation on the local structure of lattice-modulated thin films. / Gibson, J. M.; Treacy, Michael.

In: Ultramicroscopy, Vol. 14, No. 4, 1984, p. 345-349.

Research output: Contribution to journalArticle

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