The direct identification of stacking sequences in silicon carbide polytypes by high‐resolution electron microscopy

N. W. Jepps, David Smith, T. F. Page

Research output: Contribution to journalArticle

41 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)916-923
Number of pages8
JournalActa Crystallographica Section A
Volume35
Issue number6
DOIs
StatePublished - 1979
Externally publishedYes

Fingerprint

Electron Microscopy
silicon carbide

ASJC Scopus subject areas

  • Structural Biology

Cite this

The direct identification of stacking sequences in silicon carbide polytypes by high‐resolution electron microscopy. / Jepps, N. W.; Smith, David; Page, T. F.

In: Acta Crystallographica Section A, Vol. 35, No. 6, 1979, p. 916-923.

Research output: Contribution to journalArticle

@article{451b7357d801498cabe0d82f5e3a3ed1,
title = "The direct identification of stacking sequences in silicon carbide polytypes by high‐resolution electron microscopy",
author = "Jepps, {N. W.} and David Smith and Page, {T. F.}",
year = "1979",
doi = "10.1107/S0567739479002059",
language = "English (US)",
volume = "35",
pages = "916--923",
journal = "Acta Crystallographica Section A: Foundations and Advances",
issn = "0108-7673",
publisher = "John Wiley and Sons Inc.",
number = "6",

}

TY - JOUR

T1 - The direct identification of stacking sequences in silicon carbide polytypes by high‐resolution electron microscopy

AU - Jepps, N. W.

AU - Smith, David

AU - Page, T. F.

PY - 1979

Y1 - 1979

UR - http://www.scopus.com/inward/record.url?scp=67849120836&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=67849120836&partnerID=8YFLogxK

U2 - 10.1107/S0567739479002059

DO - 10.1107/S0567739479002059

M3 - Article

AN - SCOPUS:67849120836

VL - 35

SP - 916

EP - 923

JO - Acta Crystallographica Section A: Foundations and Advances

JF - Acta Crystallographica Section A: Foundations and Advances

SN - 0108-7673

IS - 6

ER -