Texture and surface morphology evolution of Ag(Cu) layers on indium tin oxide thin films

Engineering & Materials Science

• Tin oxides 100%
• Indium 94%
• Oxide films 89%
• Surface morphology 81%
• Thin films 68%
• Textures 58%
• Annealing 57%
• Atomic force microscopy 55%
• Rutherford backscattering spectroscopy 53%
• Spectrometry 37%
• Interfacial energy 35%
• Thermodynamic stability 29%
• X ray diffraction 28%
• Adatoms 27%
• Optical devices 18%
• Electromigration 18%
• Grain growth 18%
• Temperature 17%
• Metallizing 16%
• Silver 15%
• Atoms 15%
• Grain boundaries 14%
• Light emitting diodes 14%
• Hot Temperature 13%
• Vacuum 12%
• Agglomeration 12%

Physics & Astronomy

• indium oxides 71%
• tin oxides 69%
• textures 60%
• thin films 37%
• annealing 34%
• atomic force microscopy 33%
• surface energy 27%
• backscattering 25%
• thermal stability 25%
• grooving 20%
• contact potentials 19%
• electrical resistivity 18%
• electromigration 17%
• agglomeration 15%
• diffraction 15%
• spectroscopy 15%
• adatoms 14%
• x rays 13%
• temperature 12%
• silver 11%
• occurrences 11%
• light emitting diodes 11%
• chips 11%
• field effect transistors 11%
• grain boundaries 10%
• vacuum 9%
• atoms 7%

Chemical Compounds

• Crystalline Texture 70%
• Annealing 45%
• Rutherford Backscattering Spectroscopy 37%
• Atomic Force Microscopy 34%
• Interfacial Energy 28%
• Surface 23%
• Thermal Stability 19%
• Grain Growth 17%
• Adatoms 17%
• Grain Boundary 15%
• X-Ray Diffraction 14%
• Agglomeration 14%
• Liquid Film 14%
• Surface Modification 12%
• Vacuum 11%
• Compound Mobility 11%
• Resistance 9%
• Purity 7%