Original languageEnglish (US)
Pages (from-to)878-879
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2008

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Teaching
education
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Teaching advanced transmission electron microscopy. / Crozier, Peter; Carpenter, Ray; Smith, David; Weiss, Karl.

In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 08.2008, p. 878-879.

Research output: Contribution to journalArticle

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