Teaching advanced transmission electron microscopy

Peter Crozier; Ray Carpenter; David Smith; Karl Weiss

doi:10.1017/S1431927608086418

Teaching advanced transmission electron microscopy

Peter Crozier, Ray Carpenter, David Smith, Karl Weiss

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	878-879
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608086418
State	Published - Aug 2008

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927608086418

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@article{f630401da1574f72a73952c529863278,

title = "Teaching advanced transmission electron microscopy",

author = "Peter Crozier and Ray Carpenter and David Smith and Karl Weiss",

year = "2008",

month = aug,

doi = "10.1017/S1431927608086418",

language = "English (US)",

volume = "14",

pages = "878--879",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Teaching advanced transmission electron microscopy

AU - Crozier, Peter

AU - Carpenter, Ray

AU - Smith, David

AU - Weiss, Karl

PY - 2008/8

Y1 - 2008/8

UR - http://www.scopus.com/inward/record.url?scp=49549100460&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=49549100460&partnerID=8YFLogxK

U2 - 10.1017/S1431927608086418

DO - 10.1017/S1431927608086418

M3 - Article

AN - SCOPUS:49549100460

SN - 1431-9276

VL - 14

SP - 878

EP - 879

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Teaching advanced transmission electron microscopy

ASJC Scopus subject areas

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