Abstract
Hierarchical test approaches are a must for large designs due to the computational complexity and tight time-to-market requirements. In hierarchical test synthesis, test design is conducted at a subsystem level where the design complexity is manageable. For analog systems, tests are generally designed at the basic block level. This paper outlines a tool for translating basic block-level tests into system-level tests for large analog systems. Computational effectiveness is achieved by the use of high level models and by a pre-analysis of the system to identify feasible translation paths. A method to compute the fault and yield coverages of the resultant system-level tests is also provided in order to evaluate the translation. Experimental results show that test translation reduces design for testability overhead significantly while satisfying coverage requirements.
Original language | English (US) |
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Pages (from-to) | 588-599 |
Number of pages | 12 |
Journal | IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing |
Volume | 48 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2001 |
Externally published | Yes |
Keywords
- Mixed-signal systems
- Parameter tolerances
- Probabilistic fault coverage
- System-level test
ASJC Scopus subject areas
- Signal Processing
- Electrical and Electronic Engineering