TY - GEN
T1 - Synchrotron-based characterization of solar cell nanodefects
AU - Bertoni, M. I.
AU - Fenning, D. P.
AU - Rose, V.
AU - Holt, M.
AU - Maser, J.
AU - Buonassisi, T.
PY - 2011/12/1
Y1 - 2011/12/1
N2 - It is accepted throughout the photovoltaic community that the overall performance of entire modules is regulated by inhomogeneously distributed nanoscale defects inside the wafers. Over the years a variety of techniques have been used to map and characterize precipitates, grain boundaries and dislocations. However, in the race to achieve higher and higher resolutions, while studying industry-relevant material, many of these techniques fall short either due to the inherent resolution limitations of the equipment or because the combination of low defect spatial densities and strong heterogeneity, present a challenge to sample preparation and characterization. In this work, we discuss the future of synchrotron-based nanoprobe techniques for identifying defects in large volumes of commercial solar cell materials. We describe a state-of-the-art X-ray Fluorescence (XRF) nanoprobe beamline to identify the precise nature of performance-limiting defects in commercial mc-Si solar cells. For the first time, XRF with a beam spot size < 100 nm is used to characterize the contamination levels in solar cell materials.
AB - It is accepted throughout the photovoltaic community that the overall performance of entire modules is regulated by inhomogeneously distributed nanoscale defects inside the wafers. Over the years a variety of techniques have been used to map and characterize precipitates, grain boundaries and dislocations. However, in the race to achieve higher and higher resolutions, while studying industry-relevant material, many of these techniques fall short either due to the inherent resolution limitations of the equipment or because the combination of low defect spatial densities and strong heterogeneity, present a challenge to sample preparation and characterization. In this work, we discuss the future of synchrotron-based nanoprobe techniques for identifying defects in large volumes of commercial solar cell materials. We describe a state-of-the-art X-ray Fluorescence (XRF) nanoprobe beamline to identify the precise nature of performance-limiting defects in commercial mc-Si solar cells. For the first time, XRF with a beam spot size < 100 nm is used to characterize the contamination levels in solar cell materials.
UR - http://www.scopus.com/inward/record.url?scp=84861051399&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84861051399&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2011.6185867
DO - 10.1109/PVSC.2011.6185867
M3 - Conference contribution
AN - SCOPUS:84861051399
SN - 9781424499656
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 154
EP - 156
BT - Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
T2 - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Y2 - 19 June 2011 through 24 June 2011
ER -