Structural defects and luminescence features in heteroepitaxial GaN grown on on-axis and misoriented substrates

J. Bai, M. Dudley, L. Chen, Brian Skromme, B. Wagner, R. F. Davis, U. Chowdhury, R. D. Dupuis

Research output: Contribution to journalArticle

16 Scopus citations


The microstructure and luminescence properties of a series of GaN epilayers grown on sapphire and SiC substrates with various misorientations have been correlated to assess the origins of the luminescence features in the misoriented samples. Samples grown on 3.5° offcut SiC and 5° and 9° offcut sapphire substrates both exhibit photoluminescence peaks near ~3.2 and ~3.4 eV, which are absent in the on-axis SiC and sapphire cases. Transmission electron microscopy shows that the misoriented samples have configurations of I1 basal plane stacking faults, which fold into prismatic stacking faults with stair-rod dislocations at their intersections. The luminescence features are proposed to possibly arise from transitions involving the prismatic stacking faults andor the stair-rod dislocations associated with their mutual intersections and their intersections with the basal plane stacking faults.

Original languageEnglish (US)
Article number116101
JournalJournal of Applied Physics
Issue number11
StatePublished - Jun 30 2005


ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this