Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction

M. Pan; Peter Crozier

doi:10.1016/S0167-2991(06)81080-3

Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction

Research output: Contribution to journal › Article › peer-review

Abstract

Framework structures of SSZ-26 and SSZ-33 molecular sieves have been characterized in detail by using high resolution electron microscopy (HREM) and electron diffraction techniques. SSZ-26 and SSZ-33 have similar 3-D pore systems. They are the intergrowth of two end members which have intersecting 10- and 12-member rings. Direct evidence for the two polymorphs and stacking faults has been obtained. For the first time, the 2-D, 3-connected structural net for the projected framework structure has been successfully derived from experimental high resolution images.

Original language	English (US)
Pages (from-to)	48-49
Number of pages	2
Journal	Studies in Surface Science and Catalysis
Volume	98
Issue number	C
DOIs	https://doi.org/10.1016/S0167-2991(06)81080-3
State	Published - Jan 1 1995

ASJC Scopus subject areas

Catalysis
Condensed Matter Physics
Physical and Theoretical Chemistry
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0167-2991(06)81080-3

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title = "Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction",

abstract = "Framework structures of SSZ-26 and SSZ-33 molecular sieves have been characterized in detail by using high resolution electron microscopy (HREM) and electron diffraction techniques. SSZ-26 and SSZ-33 have similar 3-D pore systems. They are the intergrowth of two end members which have intersecting 10- and 12-member rings. Direct evidence for the two polymorphs and stacking faults has been obtained. For the first time, the 2-D, 3-connected structural net for the projected framework structure has been successfully derived from experimental high resolution images.",

author = "M. Pan and Peter Crozier",

year = "1995",

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doi = "10.1016/S0167-2991(06)81080-3",

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T1 - Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction

AU - Pan, M.

AU - Crozier, Peter

PY - 1995/1/1

Y1 - 1995/1/1

N2 - Framework structures of SSZ-26 and SSZ-33 molecular sieves have been characterized in detail by using high resolution electron microscopy (HREM) and electron diffraction techniques. SSZ-26 and SSZ-33 have similar 3-D pore systems. They are the intergrowth of two end members which have intersecting 10- and 12-member rings. Direct evidence for the two polymorphs and stacking faults has been obtained. For the first time, the 2-D, 3-connected structural net for the projected framework structure has been successfully derived from experimental high resolution images.

AB - Framework structures of SSZ-26 and SSZ-33 molecular sieves have been characterized in detail by using high resolution electron microscopy (HREM) and electron diffraction techniques. SSZ-26 and SSZ-33 have similar 3-D pore systems. They are the intergrowth of two end members which have intersecting 10- and 12-member rings. Direct evidence for the two polymorphs and stacking faults has been obtained. For the first time, the 2-D, 3-connected structural net for the projected framework structure has been successfully derived from experimental high resolution images.

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Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction

Abstract

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