Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction

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Abstract

Framework structures of SSZ-26 and SSZ-33 molecular sieves have been characterized in detail by using high resolution electron microscopy (HREM) and electron diffraction techniques. SSZ-26 and SSZ-33 have similar 3-D pore systems. They are the intergrowth of two end members which have intersecting 10- and 12-member rings. Direct evidence for the two polymorphs and stacking faults has been obtained. For the first time, the 2-D, 3-connected structural net for the projected framework structure has been successfully derived from experimental high resolution images.

Original languageEnglish (US)
Pages (from-to)48-49
Number of pages2
JournalStudies in Surface Science and Catalysis
Volume98
Issue numberC
DOIs
StatePublished - Jan 1 1995

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ASJC Scopus subject areas

  • Catalysis
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

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