Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms

Mina R. Bionta, Doug French, James P. Cryan, James M. Glownia, Nick Hartmann, David J. Nicholson, Kevin Baker, Christoph Bostedt, Marco Cammarrata, Matthieu Chollet, Yuntao Ding, David M. Fritz, Steve M. Durbin, Yiping Feng, Marion Harmand, Alan R. Fry, Daniel J. Kane, Jacek Krzywinski, Henrik T. Lemke, Marc Messerschmidt & 6 others Daniel F. Ratner, Sebastian Schorb, Sven Toleikisj, Diling Zhu, William E. White, Ryan N. Coffee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to ≈10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si3N4). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.

Original languageEnglish (US)
Title of host publicationX-Ray Free-Electron Lasers
Subtitle of host publicationBeam Diagnostics, Beamline Instrumentation, and Applications
Volume8504
DOIs
StatePublished - Dec 1 2012
Externally publishedYes
EventX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - San Diego, CA, United States
Duration: Aug 13 2012Aug 16 2012

Other

OtherX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
CountryUnited States
CitySan Diego, CA
Period8/13/128/16/12

Fingerprint

coding
Encoding
X rays
Laser pulses
transmissivity
pulses
x rays
Laser
Hard X-ray
Time of Arrival
Chirp
Free electron lasers
chirp
shot
lasers
arrivals
Semiconductors
Continuum
Membrane
Semiconductor materials

Keywords

  • Dielectric response
  • FEL
  • LCLS
  • Spectral encoding
  • Thin films
  • Ultrafast dynamics
  • Ultrafast optics
  • Ultrafast x-rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Bionta, M. R., French, D., Cryan, J. P., Glownia, J. M., Hartmann, N., Nicholson, D. J., ... Coffee, R. N. (2012). Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms. In X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications (Vol. 8504). [85040M] https://doi.org/10.1117/12.929097

Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms. / Bionta, Mina R.; French, Doug; Cryan, James P.; Glownia, James M.; Hartmann, Nick; Nicholson, David J.; Baker, Kevin; Bostedt, Christoph; Cammarrata, Marco; Chollet, Matthieu; Ding, Yuntao; Fritz, David M.; Durbin, Steve M.; Feng, Yiping; Harmand, Marion; Fry, Alan R.; Kane, Daniel J.; Krzywinski, Jacek; Lemke, Henrik T.; Messerschmidt, Marc; Ratner, Daniel F.; Schorb, Sebastian; Toleikisj, Sven; Zhu, Diling; White, William E.; Coffee, Ryan N.

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012. 85040M.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bionta, MR, French, D, Cryan, JP, Glownia, JM, Hartmann, N, Nicholson, DJ, Baker, K, Bostedt, C, Cammarrata, M, Chollet, M, Ding, Y, Fritz, DM, Durbin, SM, Feng, Y, Harmand, M, Fry, AR, Kane, DJ, Krzywinski, J, Lemke, HT, Messerschmidt, M, Ratner, DF, Schorb, S, Toleikisj, S, Zhu, D, White, WE & Coffee, RN 2012, Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms. in X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. vol. 8504, 85040M, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, San Diego, CA, United States, 8/13/12. https://doi.org/10.1117/12.929097
Bionta MR, French D, Cryan JP, Glownia JM, Hartmann N, Nicholson DJ et al. Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms. In X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504. 2012. 85040M https://doi.org/10.1117/12.929097
Bionta, Mina R. ; French, Doug ; Cryan, James P. ; Glownia, James M. ; Hartmann, Nick ; Nicholson, David J. ; Baker, Kevin ; Bostedt, Christoph ; Cammarrata, Marco ; Chollet, Matthieu ; Ding, Yuntao ; Fritz, David M. ; Durbin, Steve M. ; Feng, Yiping ; Harmand, Marion ; Fry, Alan R. ; Kane, Daniel J. ; Krzywinski, Jacek ; Lemke, Henrik T. ; Messerschmidt, Marc ; Ratner, Daniel F. ; Schorb, Sebastian ; Toleikisj, Sven ; Zhu, Diling ; White, William E. ; Coffee, Ryan N. / Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms. X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012.
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AU - Hartmann, Nick

AU - Nicholson, David J.

AU - Baker, Kevin

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AU - Ding, Yuntao

AU - Fritz, David M.

AU - Durbin, Steve M.

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AU - Harmand, Marion

AU - Fry, Alan R.

AU - Kane, Daniel J.

AU - Krzywinski, Jacek

AU - Lemke, Henrik T.

AU - Messerschmidt, Marc

AU - Ratner, Daniel F.

AU - Schorb, Sebastian

AU - Toleikisj, Sven

AU - Zhu, Diling

AU - White, William E.

AU - Coffee, Ryan N.

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KW - Thin films

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