Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms

Mina R. Bionta, Doug French, James P. Cryan, James M. Glownia, Nick Hartmann, David J. Nicholson, Kevin Baker, Christoph Bostedt, Marco Cammarrata, Matthieu Chollet, Yuntao Ding, David M. Fritz, Steve M. Durbin, Yiping Feng, Marion Harmand, Alan R. Fry, Daniel J. Kane, Jacek Krzywinski, Henrik T. Lemke, Marc MesserschmidtDaniel F. Ratner, Sebastian Schorb, Sven Toleikisj, Diling Zhu, William E. White, Ryan N. Coffee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to ≈10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si3N4). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.

Original languageEnglish (US)
Title of host publicationX-Ray Free-Electron Lasers
Subtitle of host publicationBeam Diagnostics, Beamline Instrumentation, and Applications
DOIs
StatePublished - Dec 1 2012
Externally publishedYes
EventX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - San Diego, CA, United States
Duration: Aug 13 2012Aug 16 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8504
ISSN (Print)0277-786X

Other

OtherX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
CountryUnited States
CitySan Diego, CA
Period8/13/128/16/12

Keywords

  • Dielectric response
  • FEL
  • LCLS
  • Spectral encoding
  • Thin films
  • Ultrafast dynamics
  • Ultrafast optics
  • Ultrafast x-rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms'. Together they form a unique fingerprint.

Cite this