Abstract
Tin monosulfide (SnS) is of interest as a potential solar cell absorber material. We present a preliminary investigation of the effects of sputtering conditions on SnS thin-film structural, optical, and electronic properties. Films were RF sputtered from an SnS target using an argon plasma. Resistivity, stoichiometry, phase, grain size and shape, bandgap, and optical absorption coefficient can be varied by modifying argon pressure for a fixed deposition time. Most films have an indirect bandgap in the range of 1.08-1.18 eV. XRD patterns confirmed the films as mostly crystalline, and grain morphology was examined using profile and surface SEM images.
Original language | English (US) |
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Pages (from-to) | 7421-7424 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 519 |
Issue number | 21 |
DOIs | |
State | Published - Aug 31 2011 |
Externally published | Yes |
Keywords
- Photovoltaics
- RF sputtering
- Solar cells
- Tin monosulfide
- Tin sulfide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry