SiL core edge fine structure in an oxidation series of silicon compounds: A comparison of microelectron energy loss spectra with theory

W. M. Skiff, Ray Carpenter, S. H. Lin

    Research output: Contribution to journalArticlepeer-review

    28 Scopus citations

    Fingerprint

    Dive into the research topics of 'SiL core edge fine structure in an oxidation series of silicon compounds: A comparison of microelectron energy loss spectra with theory'. Together they form a unique fingerprint.

    Physics & Astronomy