Abstract
This paper reviews recent work aimed at a comprehensive assessment of the potential of SiGe technology to support emerging millimeter-wave (mm-wave) and sub-mm-wave integrated circuit applications. Scaling limits, reliability constraints, and the limits of CMOS for mm-wave are addressed, followed by a diverse variety of mm-wave and sub-mm-wave SiGe circuits that are offered as examples of the many opportunities awaiting.
| Original language | English (US) |
|---|---|
| Title of host publication | 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781509016082 |
| DOIs | |
| State | Published - Nov 21 2016 |
| Externally published | Yes |
| Event | 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Austin, United States Duration: Oct 23 2016 → Oct 26 2016 |
Publication series
| Name | Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC |
|---|---|
| Volume | 2016-November |
| ISSN (Print) | 1550-8781 |
Conference
| Conference | 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 |
|---|---|
| Country | United States |
| City | Austin |
| Period | 10/23/16 → 10/26/16 |
Fingerprint
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
Cite this
SiGe Technology as a Millimeter-Wave Platform : Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. / Cressler, John D.; Coen, Chris; Zeinolabedinzadeh, Saeed; Song, Peter; Schmid, Rob; Oakley, Michael; Chakraborty, Partha.
2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2016. 7751065 (Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC; Vol. 2016-November).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - SiGe Technology as a Millimeter-Wave Platform
T2 - Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities
AU - Cressler, John D.
AU - Coen, Chris
AU - Zeinolabedinzadeh, Saeed
AU - Song, Peter
AU - Schmid, Rob
AU - Oakley, Michael
AU - Chakraborty, Partha
PY - 2016/11/21
Y1 - 2016/11/21
N2 - This paper reviews recent work aimed at a comprehensive assessment of the potential of SiGe technology to support emerging millimeter-wave (mm-wave) and sub-mm-wave integrated circuit applications. Scaling limits, reliability constraints, and the limits of CMOS for mm-wave are addressed, followed by a diverse variety of mm-wave and sub-mm-wave SiGe circuits that are offered as examples of the many opportunities awaiting.
AB - This paper reviews recent work aimed at a comprehensive assessment of the potential of SiGe technology to support emerging millimeter-wave (mm-wave) and sub-mm-wave integrated circuit applications. Scaling limits, reliability constraints, and the limits of CMOS for mm-wave are addressed, followed by a diverse variety of mm-wave and sub-mm-wave SiGe circuits that are offered as examples of the many opportunities awaiting.
UR - http://www.scopus.com/inward/record.url?scp=85005949728&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85005949728&partnerID=8YFLogxK
U2 - 10.1109/CSICS.2016.7751065
DO - 10.1109/CSICS.2016.7751065
M3 - Conference contribution
AN - SCOPUS:85005949728
T3 - Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC
BT - 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest
PB - Institute of Electrical and Electronics Engineers Inc.
ER -