SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities

John D. Cressler, Chris Coen, Saeed Zeinolabedinzadeh, Peter Song, Rob Schmid, Michael Oakley, Partha Chakraborty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper reviews recent work aimed at a comprehensive assessment of the potential of SiGe technology to support emerging millimeter-wave (mm-wave) and sub-mm-wave integrated circuit applications. Scaling limits, reliability constraints, and the limits of CMOS for mm-wave are addressed, followed by a diverse variety of mm-wave and sub-mm-wave SiGe circuits that are offered as examples of the many opportunities awaiting.

Original languageEnglish (US)
Title of host publication2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016082
DOIs
StatePublished - Nov 21 2016
Externally publishedYes
Event2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Austin, United States
Duration: Oct 23 2016Oct 26 2016

Publication series

NameTechnical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC
Volume2016-November
ISSN (Print)1550-8781

Conference

Conference2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016
CountryUnited States
CityAustin
Period10/23/1610/26/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

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    Cressler, J. D., Coen, C., Zeinolabedinzadeh, S., Song, P., Schmid, R., Oakley, M., & Chakraborty, P. (2016). SiGe Technology as a Millimeter-Wave Platform: Scaling Issues, Reliability Physics, Circuit Performance, and New Opportunities. In 2016 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2016 - Technical Digest [7751065] (Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC; Vol. 2016-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CSICS.2016.7751065