Sequential algorithms for the inspection of surface-mounted devices

J. M. Gallegos, Jesus R. Villalobos, Sergio D. Cabrera

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

This paper presents an overview of the development of vision algorithms for a flexible inspection system. This system is being designed for the inspection of surface mounted devices. The system identifies missing components and quantifies the position and rotation of the components present. Two types of approaches for the identification of missing components are presented and contrasted. The first approach involves conventional image processing techniques that are actually used in an operative prototype that is under test in an industrial environment. The second approach is a study of the use of backpropagation neural networks in as an alternative inspection method for component detection only.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsDavid P. Casasent
Pages215-226
Number of pages12
StatePublished - Dec 1 1994
Externally publishedYes
EventIntelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision - Boston, MA, USA
Duration: Nov 2 1994Nov 4 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2354
ISSN (Print)0277-786X

Other

OtherIntelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision
CityBoston, MA, USA
Period11/2/9411/4/94

    Fingerprint

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Gallegos, J. M., Villalobos, J. R., & Cabrera, S. D. (1994). Sequential algorithms for the inspection of surface-mounted devices. In D. P. Casasent (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 215-226). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2354).