Scenario-based test case generation for state-based embedded systems

W. T. Tsai, L. Yu, X. X. Liu, A. Saimi, Y. Xiao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

To reduce testing cost and effort, the paper proposes a systematic approach to generate test cases for state-based embedded systems. This process first derives a state/event tree based on a scenario specification, with a node of the tree representing a state, and a link a transition between two states. Once the tree is obtained, it is possible to generate test inputs based on partition testing, random testing and boundary value testing. It is also possible to perform various analyses such as completeness and consistency analysis, dependency analysis and relationship analysis. An XML-based tool has been developed to automate many of the steps in the process. Whenever there is a change to the system, the tester needs to modify the state/event tree, and the tool automatically re-generates the new test cases to test those changed parts as well as perform selective regression testing to test those affected parts. To illustrate the ideas, the paper uses a wireless mobile phone system as an example. The system consists of three parts: a mobile station center server, several base station servers, and clients.

Original languageEnglish (US)
Title of host publicationConference Proceedings of the IEEE International Performance, Computing, and Communications Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages335-342
Number of pages8
Volume2003-January
ISBN (Print)0780378938
DOIs
StatePublished - 2003
Event22nd IEEE International Performance, Computing, and Communications Conference, IPCCC 2003 - Phoenix, United States
Duration: Apr 9 2003Apr 11 2003

Other

Other22nd IEEE International Performance, Computing, and Communications Conference, IPCCC 2003
CountryUnited States
CityPhoenix
Period4/9/034/11/03

Fingerprint

Embedded systems
Testing
Servers
Mobile phones
XML
Base stations
Specifications
Costs

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Tsai, W. T., Yu, L., Liu, X. X., Saimi, A., & Xiao, Y. (2003). Scenario-based test case generation for state-based embedded systems. In Conference Proceedings of the IEEE International Performance, Computing, and Communications Conference (Vol. 2003-January, pp. 335-342). [1203716] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PCCC.2003.1203716

Scenario-based test case generation for state-based embedded systems. / Tsai, W. T.; Yu, L.; Liu, X. X.; Saimi, A.; Xiao, Y.

Conference Proceedings of the IEEE International Performance, Computing, and Communications Conference. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. p. 335-342 1203716.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tsai, WT, Yu, L, Liu, XX, Saimi, A & Xiao, Y 2003, Scenario-based test case generation for state-based embedded systems. in Conference Proceedings of the IEEE International Performance, Computing, and Communications Conference. vol. 2003-January, 1203716, Institute of Electrical and Electronics Engineers Inc., pp. 335-342, 22nd IEEE International Performance, Computing, and Communications Conference, IPCCC 2003, Phoenix, United States, 4/9/03. https://doi.org/10.1109/PCCC.2003.1203716
Tsai WT, Yu L, Liu XX, Saimi A, Xiao Y. Scenario-based test case generation for state-based embedded systems. In Conference Proceedings of the IEEE International Performance, Computing, and Communications Conference. Vol. 2003-January. Institute of Electrical and Electronics Engineers Inc. 2003. p. 335-342. 1203716 https://doi.org/10.1109/PCCC.2003.1203716
Tsai, W. T. ; Yu, L. ; Liu, X. X. ; Saimi, A. ; Xiao, Y. / Scenario-based test case generation for state-based embedded systems. Conference Proceedings of the IEEE International Performance, Computing, and Communications Conference. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. pp. 335-342
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