Reliable systems on unreliable fabrics

Todd Austin, Valeria Bertacco, Scott Mahlke, Yu Cao

Research output: Contribution to journalArticle

42 Scopus citations

Abstract

The continued scaling of silicon fabrication technology has led to significant reliability concerns, which are quickly becoming a dominant design challenge. Design integrity is threatened by complexity challenges in the form of immense designs defying complete verification, and physical challenges such as silicon aging and soft errors, which impair correct system operation. The Gigascale Systems Research Center Resilient-System Design Team is addressing these key challenges through synergistic research thrusts, ranging from near-term reliability stress reduction techniques to methods for improving the quality of today's silicon, to longer-term technologies that can detect, recover, and repair faulty systems. These efforts are supported and complemented by an active fault-modeling research effort and a strong focus on functional-verification methodologies. The team's goal is to provide highly effective, low-cost solutions to ensure both correctness and reliability in future designs and technology nodes, thereby extending the lifetime of silicon fabrication technologies beyond what can be currently foreseen as profitable.

Original languageEnglish (US)
Pages (from-to)322-332
Number of pages11
JournalIEEE Design and Test of Computers
Volume25
Issue number4
DOIs
StatePublished - Aug 21 2008

Keywords

  • Degradation
  • Fabrication
  • Fault-modeling research
  • GSRC
  • Integrated circuit reliability
  • Reliability
  • Reliability engineering
  • Reliability stress reduction
  • Reliable systems
  • Resilient-System Design Team
  • Silicon
  • Silicon fabrication technologies
  • Stress
  • Unreliable fabrics

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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