Fingerprint
Dive into the research topics of 'Relationship of basal plane and prismatic stacking faults in GaN to low temperature photoluminescence peaks at ∼3.4 eV and ∼3.2 eV'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Relationship of basal plane and prismatic stacking faults in GaN to low temperature photoluminescence peaks at ∼3.4 eV and ∼3.2 eV
J. Bai, M. Dudley, L. Chen, Brian Skromme, P. J. Hartlieb, E. Michaels, J. W. Kolis, B. Wagner, R. F. Davis, U. Chowdhury, R. D. Dupuis
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Scopus
citations