Recovery of valuable and toxic metals from crystalline-Si modules

Wen Hsi Huang, Woo Jung Shin, Laidong Wang, Meng Tao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Valuable and toxic metals including Ag, Pb, Sn and Cu can be recovered from end-of-life Si solar modules. This study presents the recovery of Ag, Pb, Sn and Cu from a simulated leach solution of crystalline-Si modules. 11.4% HNO3 is used as the leach solution. Ag, Pb, Sn and Cu pellets are dissolved in the solution to simulate the metals from front contacts and soldered wires in Si modules. Sn precipitates in the solution as SnO2, which can be separated by filtration or sedimentation. Voltammetry reveals the reduction potentials for Ag and Cu. It is demonstrated that 3-electrode sequential electrowinning can extract Ag and Cu one by one from the solution. The recovery rates of Ag and Cu are 74% and 83%, respectively. Toxic Pb is deposited on the anode as PbO2 during Cu recovery. The purity of the extracted metals is above 99%.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781509056057
DOIs
StatePublished - May 25 2018
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period6/25/176/30/17

Keywords

  • Crystalline-Si solar cells
  • Electrowinning
  • End-of-life Si solar cells
  • Recycling
  • Voltammetry

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Huang, W. H., Shin, W. J., Wang, L., & Tao, M. (2018). Recovery of valuable and toxic metals from crystalline-Si modules. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366856