RASSS: A perfidy-aware protocol for designing trustworthy distributed systems

Lake Bu, Hien D. Nguyen, Michel A. Kinsy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Robust Adaptive Secure Secret Sharing (RASSS) is a protocol for reconstructing secrets and information in distributed computing systems even in the presence of a large number of untrusted participants. Since the original Shamir's Secret Sharing scheme, there have been efforts to secure the technique against dishonest shareholders. Early on, researchers determined that the Reed-Solomon encoding property of the Shamir's share distribution equation and its decoding algorithm could tolerate cheaters up to one third of the total shareholders. However, if the number of cheaters grows beyond the error correcting capability (distance) of the Reed-Solomon codes, the reconstruction of the secret is hindered. Untrusted participants or cheaters could hide in the decoding procedure, or even frame up the honest parties. In this paper, we solve this challenge and propose a secure protocol that is no longer constrained by the limitations of the Reed-Solomon codes. As long as there are a minimum number of honest shareholders, the RASSS protocol is able to identify the cheaters and retrieve the correct secret or information in a distributed system with a probability close to 1 with less than 60% of hardware overhead. Furthermore, the adaptive nature of the protocol enables considerable hardware and timing resource savings and makes RASSS highly practical.

Original languageEnglish (US)
Title of host publication2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
ISBN (Electronic)9781538603628
DOIs
StatePublished - Jun 28 2017
Externally publishedYes
Event13th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017 - Cambridge, United Kingdom
Duration: Oct 23 2017Oct 25 2017

Publication series

Name2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
Volume2018-January

Other

Other13th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
Country/TerritoryUnited Kingdom
CityCambridge
Period10/23/1710/25/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Hardware and Architecture

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