Abstract
A description is given of a new particle-analysis procedure capable of background subtraction over the entire spectrum and of fitting the x-ray peaks for a 15-element sample in under 2 min. It consists of TWIST, a relatively simple, fast, and yet accurate routine for background subraction, and QKFIT, a linear least-squares fitting routine that uses simplifications designed to increase the speed of analysis. All data were collected on a JEOL JSM-35 scanning electron microscope with a PGT-1000 detector, analyzer, and 32K computer with four floppy-disk drives.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings, Annual Conference - Microbeam Analysis Society |
| Place of Publication | San Francisco Press, Calif |
| Publisher | Inc |
| Pages | 254-258 |
| Number of pages | 5 |
| State | Published - 1979 |
| Externally published | Yes |
| Event | Proc Annu Conf Microbeam Anal Soc 14th - San Antonio, Tex Duration: Aug 12 1979 → Aug 17 1979 |
Other
| Other | Proc Annu Conf Microbeam Anal Soc 14th |
|---|---|
| City | San Antonio, Tex |
| Period | 8/12/79 → 8/17/79 |
ASJC Scopus subject areas
- General Engineering