Rapid embedded system testing using verification patterns

Wei Tek Tsai; Lian Yu; Feng Zhu; Raymond Paul

doi:10.1109/MS.2005.103

Rapid embedded system testing using verification patterns

Wei Tek Tsai, Lian Yu, Feng Zhu, Raymond Paul

Computing and Augmented Intelligence, School of (IAFSE-SCAI)

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

A verification pattern approach for rapidly testing real-time embedded systems first classifies system scenarios into patterns. For each scenario pattern, the VP approach then develops a test script template for all the scenarios belonging to that pattern. In this way, instead of developing numerous scripts to test the system, test engineers can customize and reuse a set of script templates to test the entire application, saving significant effort and time.

Original language	English (US)
Pages (from-to)	68-75
Number of pages	8
Journal	IEEE Software
Volume	22
Issue number	4
DOIs	https://doi.org/10.1109/MS.2005.103
State	Published - Jul 2005

ASJC Scopus subject areas

Software

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10.1109/MS.2005.103

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abstract = "A verification pattern approach for rapidly testing real-time embedded systems first classifies system scenarios into patterns. For each scenario pattern, the VP approach then develops a test script template for all the scenarios belonging to that pattern. In this way, instead of developing numerous scripts to test the system, test engineers can customize and reuse a set of script templates to test the entire application, saving significant effort and time.",

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Rapid embedded system testing using verification patterns

Abstract

ASJC Scopus subject areas

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