Rapid embedded system testing using verification patterns

Wei Tek Tsai, Lian Yu, Feng Zhu, Raymond Paul

Research output: Contribution to journalArticle

28 Scopus citations

Abstract

A verification pattern approach for rapidly testing real-time embedded systems first classifies system scenarios into patterns. For each scenario pattern, the VP approach then develops a test script template for all the scenarios belonging to that pattern. In this way, instead of developing numerous scripts to test the system, test engineers can customize and reuse a set of script templates to test the entire application, saving significant effort and time.

Original languageEnglish (US)
Pages (from-to)68-75
Number of pages8
JournalIEEE Software
Volume22
Issue number4
DOIs
StatePublished - Jul 1 2005

ASJC Scopus subject areas

  • Software

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