Quantitative characterisation of surface defects and composition on PtRu nanoparticles using aberration-corrected TEM/STEM

Lan-Yun Chang, S. Lazar, E. A. Baranova, C. Bock, G. A. Botton

Research output: Contribution to journalArticle

2 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)1416-1417
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009
Externally publishedYes

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Surface defects
surface defects
Aberrations
Surface structure
aberration
Nanoparticles
Transmission electron microscopy
nanoparticles
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Quantitative characterisation of surface defects and composition on PtRu nanoparticles using aberration-corrected TEM/STEM. / Chang, Lan-Yun; Lazar, S.; Baranova, E. A.; Bock, C.; Botton, G. A.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 01.07.2009, p. 1416-1417.

Research output: Contribution to journalArticle

Chang, Lan-Yun ; Lazar, S. ; Baranova, E. A. ; Bock, C. ; Botton, G. A. / Quantitative characterisation of surface defects and composition on PtRu nanoparticles using aberration-corrected TEM/STEM. In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 1416-1417.
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