Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To record low-dose high resolution electron microscope (HREM) images from zeolites with the combination with real-space averaging techniques has been shown to be successful using a slow-scan CCD camera in obtaining the averaged unit cell with high signal-to-noise ratio (SNR). The paper shows that the CCD camera can be used to make meaningful and quantitative intensity measurements of images and diffraction patterns from zeolites. Quantitative measurement of diffraction intensities and comparison with dynamical calculations have also been carried out for ZSM-5.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages670-671
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

Fingerprint

CCD cameras
Image resolution
Zeolites
Diffraction patterns
Chemical analysis
Signal to noise ratio
Electron microscopes
Diffraction

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Pan, M., & Crozier, P. (1993). Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 670-671). Publ by San Francisco Press Inc.

Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera. / Pan, M.; Crozier, Peter.

Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. p. 670-671.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pan, M & Crozier, P 1993, Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera. in Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, pp. 670-671, Proceedings of the 51st Annual Meeting Microscopy Society of America, Cincinnati, OH, USA, 8/1/93.
Pan M, Crozier P. Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera. In Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc. 1993. p. 670-671
Pan, M. ; Crozier, Peter. / Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera. Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. pp. 670-671
@inproceedings{fe5c46bc5df8453c8c3fdea9bde824b9,
title = "Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera",
abstract = "To record low-dose high resolution electron microscope (HREM) images from zeolites with the combination with real-space averaging techniques has been shown to be successful using a slow-scan CCD camera in obtaining the averaged unit cell with high signal-to-noise ratio (SNR). The paper shows that the CCD camera can be used to make meaningful and quantitative intensity measurements of images and diffraction patterns from zeolites. Quantitative measurement of diffraction intensities and comparison with dynamical calculations have also been carried out for ZSM-5.",
author = "M. Pan and Peter Crozier",
year = "1993",
language = "English (US)",
pages = "670--671",
booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",
publisher = "Publ by San Francisco Press Inc",

}

TY - GEN

T1 - Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera

AU - Pan, M.

AU - Crozier, Peter

PY - 1993

Y1 - 1993

N2 - To record low-dose high resolution electron microscope (HREM) images from zeolites with the combination with real-space averaging techniques has been shown to be successful using a slow-scan CCD camera in obtaining the averaged unit cell with high signal-to-noise ratio (SNR). The paper shows that the CCD camera can be used to make meaningful and quantitative intensity measurements of images and diffraction patterns from zeolites. Quantitative measurement of diffraction intensities and comparison with dynamical calculations have also been carried out for ZSM-5.

AB - To record low-dose high resolution electron microscope (HREM) images from zeolites with the combination with real-space averaging techniques has been shown to be successful using a slow-scan CCD camera in obtaining the averaged unit cell with high signal-to-noise ratio (SNR). The paper shows that the CCD camera can be used to make meaningful and quantitative intensity measurements of images and diffraction patterns from zeolites. Quantitative measurement of diffraction intensities and comparison with dynamical calculations have also been carried out for ZSM-5.

UR - http://www.scopus.com/inward/record.url?scp=0027707149&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027707149&partnerID=8YFLogxK

M3 - Conference contribution

SP - 670

EP - 671

BT - Proceedings - Annual Meeting, Microscopy Society of America

PB - Publ by San Francisco Press Inc

ER -