Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To record low-dose high resolution electron microscope (HREM) images from zeolites with the combination with real-space averaging techniques has been shown to be successful using a slow-scan CCD camera in obtaining the averaged unit cell with high signal-to-noise ratio (SNR). The paper shows that the CCD camera can be used to make meaningful and quantitative intensity measurements of images and diffraction patterns from zeolites. Quantitative measurement of diffraction intensities and comparison with dynamical calculations have also been carried out for ZSM-5.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages670-671
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Pan, M., & Crozier, P. (1993). Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 670-671). Publ by San Francisco Press Inc.