Prospects for single-particle imaging at XFELs

H. N. Chapman, S. P. Hau-Riege, R. A. London, S. Marchesini, A. Noy, A. Szoke, H. Szoke, E. Ingerman, J. Hajdu, G. Huldt, M. R. Howells, H. He, John Spence, Uwe Weierstall

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Engineering & Materials Science

Physics & Astronomy