TY - GEN
T1 - Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations
AU - Li, Xin
AU - Cao, Yu
N1 - Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2008
Y1 - 2008
N2 - Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about high-dimensional strongly nonlinear performance variations that cannot be accurately captured by linear or quadratic response surface models. In this paper, we propose a novel projection-based piecewise linear modeling technique, P2M, to address such a modeling challenge with affordable computational cost. P2M borrows the projection pursuit idea from mathematics to convert a high-dimensional modeling problem to a low-dimensional one. In addition, a new piecewise-linear model template is proposed and tuned for strongly nonlinear performance variations. By exploiting the unique piecewise-linear nature of the model template, a robust numerical algorithm is further developed to determine all model coefficients by solving a sequence of over-determined linear equations. Several circuit examples designed in a commercial 65nm CMOS process demonstrate that compared with the traditional quadratic modeling, P2M achieves 2x error reduction with negligible computational overhead.
AB - Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about high-dimensional strongly nonlinear performance variations that cannot be accurately captured by linear or quadratic response surface models. In this paper, we propose a novel projection-based piecewise linear modeling technique, P2M, to address such a modeling challenge with affordable computational cost. P2M borrows the projection pursuit idea from mathematics to convert a high-dimensional modeling problem to a low-dimensional one. In addition, a new piecewise-linear model template is proposed and tuned for strongly nonlinear performance variations. By exploiting the unique piecewise-linear nature of the model template, a robust numerical algorithm is further developed to determine all model coefficients by solving a sequence of over-determined linear equations. Several circuit examples designed in a commercial 65nm CMOS process demonstrate that compared with the traditional quadratic modeling, P2M achieves 2x error reduction with negligible computational overhead.
UR - http://www.scopus.com/inward/record.url?scp=49749094794&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=49749094794&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2008.4479708
DO - 10.1109/ISQED.2008.4479708
M3 - Conference contribution
AN - SCOPUS:49749094794
SN - 0769531172
SN - 9780769531175
T3 - Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
SP - 108
EP - 113
BT - Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
T2 - 9th International Symposium on Quality Electronic Design, ISQED 2008
Y2 - 17 March 2008 through 19 March 2008
ER -