Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations

Xin Li, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about high-dimensional strongly nonlinear performance variations that cannot be accurately captured by linear or quadratic response surface models. In this paper, we propose a novel projection-based piecewise linear modeling technique, P2M, to address such a modeling challenge with affordable computational cost. P2M borrows the projection pursuit idea from mathematics to convert a high-dimensional modeling problem to a low-dimensional one. In addition, a new piecewise-linear model template is proposed and tuned for strongly nonlinear performance variations. By exploiting the unique piecewise-linear nature of the model template, a robust numerical algorithm is further developed to determine all model coefficients by solving a sequence of over-determined linear equations. Several circuit examples designed in a commercial 65nm CMOS process demonstrate that compared with the traditional quadratic modeling, P2M achieves 2x error reduction with negligible computational overhead.

Original languageEnglish (US)
Title of host publicationProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
Pages108-113
Number of pages6
DOIs
StatePublished - 2008
Event9th International Symposium on Quality Electronic Design, ISQED 2008 - San Jose, CA, United States
Duration: Mar 17 2008Mar 19 2008

Other

Other9th International Symposium on Quality Electronic Design, ISQED 2008
CountryUnited States
CitySan Jose, CA
Period3/17/083/19/08

Fingerprint

Linear equations
Networks (circuits)
Costs

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Li, X., & Cao, Y. (2008). Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations. In Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008 (pp. 108-113). [4479708] https://doi.org/10.1109/ISQED.2008.4479708

Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations. / Li, Xin; Cao, Yu.

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008. 2008. p. 108-113 4479708.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, X & Cao, Y 2008, Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations. in Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008., 4479708, pp. 108-113, 9th International Symposium on Quality Electronic Design, ISQED 2008, San Jose, CA, United States, 3/17/08. https://doi.org/10.1109/ISQED.2008.4479708
Li X, Cao Y. Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations. In Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008. 2008. p. 108-113. 4479708 https://doi.org/10.1109/ISQED.2008.4479708
Li, Xin ; Cao, Yu. / Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations. Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008. 2008. pp. 108-113
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