Abstract
This study examines the performance of 15kV Cross-linked Polyethylene (XLPE) insulated new and aged cable (taken out from the service after 10 + years) in context with electrical tree and electrical breakdown failure of cable. The breakdown tests are performed using needle plane geometry at room temperature as well as elevated temperature of 100°C. The statistical technique namely regression analysis is utilized for analysis of the test results, as well as to predict the future performance and life expectancy of cables. The analytical technique, Fourier Transform Infra-Red (FTIR) spectroscopy is used to study the permanent changes in the XLPE material. This study identifies the permanent changes occurring in the material that lead to progressive degradation and/or failure in the long run.
| Original language | English (US) |
|---|---|
| Title of host publication | Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report |
| Pages | 421-424 |
| Number of pages | 4 |
| State | Published - 2002 |
| Event | 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico Duration: Oct 20 2002 → Oct 24 2002 |
Other
| Other | 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena |
|---|---|
| Country/Territory | Mexico |
| City | Cancun |
| Period | 10/20/02 → 10/24/02 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Building and Construction