Potential induced degradation of pre-stressed photovoltaic modules: Effect of glass surface conductivity disruption

S. Tatapudi, F. Ebneali, J. Kuitche, Govindasamy Tamizhmani

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    Potential induced degradation (PID) due to high system voltages is considered as one of the possible degradation mechanisms of PV modules in the field. In the previous studies carried out at ASU-PRL, the surface conductivity of the entire glass was obtained using either conductive carbon layer (covering the entire glass surface and extending it to the frame) or humidity inside an environmental chamber. This study investigates the influence of disruption of glass surface conductivity on the PID. In this study, the conductive carbon layer was applied on the module's glass surface but without extending it to the frame and hence the surface conductivity was disrupted (no carbon layer) at 2 cm distance from the periphery of frame's inner edges. This study was carried out on the modules of different manufacturers under dry heat conditions at multiple stress temperatures and voltages. To replicate closeness to the field-aged modules, half of the selected modules for the PID investigation were pre-stressed under damp heat for 1000 hours and the other half under thermal cycling for 200 cycles. When the surface continuity was disrupted, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a transparent hydrophobic layer near the inner edges of the frame or by attaching the frameless laminate with the conductivity disrupting mounting methods such as glue-on rail on the backsheet.

    Original languageEnglish (US)
    Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages1604-1609
    Number of pages6
    ISBN (Print)9781479932993
    DOIs
    StatePublished - 2013
    Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
    Duration: Jun 16 2013Jun 21 2013

    Other

    Other39th IEEE Photovoltaic Specialists Conference, PVSC 2013
    CountryUnited States
    CityTampa, FL
    Period6/16/136/21/13

    Fingerprint

    Degradation
    Glass
    Carbon
    Environmental chambers
    Glues
    Electric potential
    Thermal cycling
    Mountings
    Laminates
    Rails
    Atmospheric humidity
    Temperature
    Water
    Hot Temperature

    Keywords

    • Durability
    • Leakage current
    • Potential induced degradation
    • Reliability
    • System voltage

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering

    Cite this

    Tatapudi, S., Ebneali, F., Kuitche, J., & Tamizhmani, G. (2013). Potential induced degradation of pre-stressed photovoltaic modules: Effect of glass surface conductivity disruption. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 1604-1609). [6744452] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2013.6744452

    Potential induced degradation of pre-stressed photovoltaic modules : Effect of glass surface conductivity disruption. / Tatapudi, S.; Ebneali, F.; Kuitche, J.; Tamizhmani, Govindasamy.

    Conference Record of the IEEE Photovoltaic Specialists Conference. Institute of Electrical and Electronics Engineers Inc., 2013. p. 1604-1609 6744452.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Tatapudi, S, Ebneali, F, Kuitche, J & Tamizhmani, G 2013, Potential induced degradation of pre-stressed photovoltaic modules: Effect of glass surface conductivity disruption. in Conference Record of the IEEE Photovoltaic Specialists Conference., 6744452, Institute of Electrical and Electronics Engineers Inc., pp. 1604-1609, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States, 6/16/13. https://doi.org/10.1109/PVSC.2013.6744452
    Tatapudi S, Ebneali F, Kuitche J, Tamizhmani G. Potential induced degradation of pre-stressed photovoltaic modules: Effect of glass surface conductivity disruption. In Conference Record of the IEEE Photovoltaic Specialists Conference. Institute of Electrical and Electronics Engineers Inc. 2013. p. 1604-1609. 6744452 https://doi.org/10.1109/PVSC.2013.6744452
    Tatapudi, S. ; Ebneali, F. ; Kuitche, J. ; Tamizhmani, Govindasamy. / Potential induced degradation of pre-stressed photovoltaic modules : Effect of glass surface conductivity disruption. Conference Record of the IEEE Photovoltaic Specialists Conference. Institute of Electrical and Electronics Engineers Inc., 2013. pp. 1604-1609
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