Plane wave scattering from a curved HIS: Normal incidence

Ahmet C. Durgun, Constantine Balanis, Craig R. Birtcher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

An approximate analytical method is developed to characterize the reflection properties of a cylindrically curved high impedance surface (HIS). This method assumes a homogenized model for the curved HIS which can be extracted from the reflection properties of the flat HIS. In this work, only the normal incidence case is considered for TEz and TMz polarizations.

Original languageEnglish (US)
Title of host publication2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings
DOIs
StatePublished - 2012
EventJoint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012 - Chicago, IL, United States
Duration: Jul 8 2012Jul 14 2012

Publication series

NameIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
ISSN (Print)1522-3965

Other

OtherJoint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012
Country/TerritoryUnited States
CityChicago, IL
Period7/8/127/14/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Plane wave scattering from a curved HIS: Normal incidence'. Together they form a unique fingerprint.

Cite this