Abstract
This paper demonstrates methodologies for designing soft-error hardened logic on commercial foundry processes. Physical design flows employ standard CAD tools to provide spatial separation that alleviates risk of multiple node charge collection upsets. To demonstrate and compare the proposed techniques, an advanced encryption standard (AES) encryption engine is implemented with the proposed methodologies. The methodologies incur an area overhead of 3.4× for a self-correcting, transient immune TMR design and 1.6× for a design using TMR flip-flops with non-redundant logic providing only single-event upset mitigation, over a non-redundant design. Power dissipation increases to 4.82× and 2.4×, respectively.
Original language | English (US) |
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Title of host publication | 2015 15th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Volume | 2015-December |
ISBN (Electronic) | 9781509002313 |
DOIs | |
State | Published - Dec 24 2015 |
Externally published | Yes |
Event | 15th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2015 - Moscow, Russian Federation Duration: Sep 14 2015 → Sep 18 2015 |
Other
Other | 15th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2015 |
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Country/Territory | Russian Federation |
City | Moscow |
Period | 9/14/15 → 9/18/15 |
Keywords
- ASIC
- Physical Design Methodology
- RHBD
- Soft-Error mitigation
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Radiation