@inproceedings{62188e8a79cc4150965aee7aefc0d6da,
title = "Performance degradation of grid-tied photovoltaic modules in a hot-dry climatic condition",
abstract = "The crystalline silicon photovoltaic (PV) modules under open circuit conditions typically degrade at a rate of about 0.5% per year. However, it is suspected that the modules in an array level may degrade, depending on equipment/frame grounding and array grounding, at higher rates because of higher string voltage and increased module mismatch over the years of operation in the field. This paper compares and analyzes the degradation rates of grid-tied photovoltaic modules operating over 10-17 years in a desert climatic condition of Arizona. The nameplate open-circuit voltages of the arrays ranged between 400 and 450 V. Six different types/models of crystalline silicon modules with glass/glass and glass/polymer constructions were evaluated. About 1865 modules were inspected using an extended visual inspection checklist and infrared (IR) scanning. The visual inspection checklist included encapsulant discoloration, cell/interconnect cracks, delamination and corrosion. Based on the visual inspection and IR studies, a large fraction of these modules were identified as allegedly healthy and unhealthy modules and they were electrically isolated from the system for currentvoltage (I-V) measurements of individual modules. The annual degradation rate for each module type is determined based on the I-V measurements.",
keywords = "Degradation, Failure modes, Reliability",
author = "Adam Suleske and Jaspreet Singh and Joseph Kuitche and Govindasamy TamizhMani",
year = "2011",
doi = "10.1117/12.894928",
language = "English (US)",
isbn = "9780819487223",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
booktitle = "Reliability of Photovoltaic Cells, Modules, Components, and Systems IV",
note = "Reliability of Photovoltaic Cells, Modules, Components, and Systems IV ; Conference date: 22-08-2011 Through 25-08-2011",
}