@inproceedings{17cc032c17bc431ab9c2402d437f6abe,
title = "Overview of resistive switching memory (RRAM) switching mechanism and device modeling",
abstract = "In this paper, the recent progress on the understandings of the switching mechanisms in oxide resistive switching memory (RRAM) is reviewed. Several representative device modeling approaches including numerical discretized models, numerical continuous models and analytical compact models are discussed using HfOx bipolar RRAM as a model system. The future challenges of RRAM modeling are finally discussed.",
keywords = "RRAM, mechanism, modeling, resistive switching",
author = "Shimeng Yu",
year = "2014",
month = jan,
day = "1",
doi = "10.1109/ISCAS.2014.6865560",
language = "English (US)",
isbn = "9781479934324",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2017--2020",
booktitle = "2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014",
note = "2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 ; Conference date: 01-06-2014 Through 05-06-2014",
}