Optimal Scheduling of Signature Analysis for VLSI Testing

Y. H. Lee, C. M. Krishna

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Signature analysis has become a popular way of testing VLSI circuits. We present a simple algorithm to optimally schedule the signature analyses. The objective is to minimize the mean testing time per VLSI circuit.

Original languageEnglish (US)
Pages (from-to)336-341
Number of pages6
JournalIEEE Transactions on Computers
Volume40
Issue number3
DOIs
StatePublished - Mar 1991
Externally publishedYes

ASJC Scopus subject areas

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

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