Abstract

In 1806, Humphrey Davey said that "nothing promotes the advancement of science so much as a new instrument". This paper reviews some of the lesser-known achievements of Ondrej's early career, and reminds us of the level of performance of instruments in those days, in order to appreciate how great has been the progress in instrumentation, much of it due to Ondrej and his leadership, since then. Some new results in the field of EELS are described, including extraction of the time-dependence of the dielectric response (with better time resolution than an X-ray free electron laser (XFEL)) from Nion EELS data. An approximation for atomic-resolution imaging which includes multiple scattering effects is given for biological samples, for use with aberration-corrected instruments when these become needed at the higher beam energies required to preserve the projection approximation, on which the 3D merging of single-particle cryo-EM images is based. We also discuss the requirements for out-running radiation damage using pulsed electron beams, a worthy final challenge for OLK.

Original languageEnglish (US)
JournalUltramicroscopy
DOIs
StateAccepted/In press - Oct 2 2016

Fingerprint

Electron energy loss spectroscopy
X ray lasers
Multiple scattering
Free electron lasers
Radiation damage
Aberrations
leadership
Merging
Electron beams
approximation
radiation damage
free electron lasers
time dependence
Imaging techniques
aberration
projection
electron beams
requirements
scattering
x rays

Keywords

  • Energy-loss spectroscopy cryo-EM
  • Radiation damage

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Ondrej Krivanek's early scientific research. / Spence, John.

In: Ultramicroscopy, 02.10.2016.

Research output: Contribution to journalArticle

@article{e099d5f5a9ae4d51a85abd36067a5c51,
title = "Ondrej Krivanek's early scientific research",
abstract = "In 1806, Humphrey Davey said that {"}nothing promotes the advancement of science so much as a new instrument{"}. This paper reviews some of the lesser-known achievements of Ondrej's early career, and reminds us of the level of performance of instruments in those days, in order to appreciate how great has been the progress in instrumentation, much of it due to Ondrej and his leadership, since then. Some new results in the field of EELS are described, including extraction of the time-dependence of the dielectric response (with better time resolution than an X-ray free electron laser (XFEL)) from Nion EELS data. An approximation for atomic-resolution imaging which includes multiple scattering effects is given for biological samples, for use with aberration-corrected instruments when these become needed at the higher beam energies required to preserve the projection approximation, on which the 3D merging of single-particle cryo-EM images is based. We also discuss the requirements for out-running radiation damage using pulsed electron beams, a worthy final challenge for OLK.",
keywords = "Energy-loss spectroscopy cryo-EM, Radiation damage",
author = "John Spence",
year = "2016",
month = "10",
day = "2",
doi = "10.1016/j.ultramic.2016.12.006",
language = "English (US)",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",

}

TY - JOUR

T1 - Ondrej Krivanek's early scientific research

AU - Spence, John

PY - 2016/10/2

Y1 - 2016/10/2

N2 - In 1806, Humphrey Davey said that "nothing promotes the advancement of science so much as a new instrument". This paper reviews some of the lesser-known achievements of Ondrej's early career, and reminds us of the level of performance of instruments in those days, in order to appreciate how great has been the progress in instrumentation, much of it due to Ondrej and his leadership, since then. Some new results in the field of EELS are described, including extraction of the time-dependence of the dielectric response (with better time resolution than an X-ray free electron laser (XFEL)) from Nion EELS data. An approximation for atomic-resolution imaging which includes multiple scattering effects is given for biological samples, for use with aberration-corrected instruments when these become needed at the higher beam energies required to preserve the projection approximation, on which the 3D merging of single-particle cryo-EM images is based. We also discuss the requirements for out-running radiation damage using pulsed electron beams, a worthy final challenge for OLK.

AB - In 1806, Humphrey Davey said that "nothing promotes the advancement of science so much as a new instrument". This paper reviews some of the lesser-known achievements of Ondrej's early career, and reminds us of the level of performance of instruments in those days, in order to appreciate how great has been the progress in instrumentation, much of it due to Ondrej and his leadership, since then. Some new results in the field of EELS are described, including extraction of the time-dependence of the dielectric response (with better time resolution than an X-ray free electron laser (XFEL)) from Nion EELS data. An approximation for atomic-resolution imaging which includes multiple scattering effects is given for biological samples, for use with aberration-corrected instruments when these become needed at the higher beam energies required to preserve the projection approximation, on which the 3D merging of single-particle cryo-EM images is based. We also discuss the requirements for out-running radiation damage using pulsed electron beams, a worthy final challenge for OLK.

KW - Energy-loss spectroscopy cryo-EM

KW - Radiation damage

UR - http://www.scopus.com/inward/record.url?scp=85014066634&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85014066634&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2016.12.006

DO - 10.1016/j.ultramic.2016.12.006

M3 - Article

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

ER -