Off-axis electron holography of pseudo-spin-valve thin-film magnetic elements

T. Kasama; P. Barpanda; R. E. Dunin-Borkowski; S. B. Newcomb; Martha McCartney; F. J. Castaño; C. A. Ross

doi:10.1063/1.1943511

Off-axis electron holography of pseudo-spin-valve thin-film magnetic elements

T. Kasama, P. Barpanda, R. E. Dunin-Borkowski, S. B. Newcomb, Martha McCartney, F. J. Castaño, C. A. Ross

Physics

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Magnetic remanent states in a rectangular array of 75×280- nm2 NiFeCuCo thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

Original language	English (US)
Article number	013903
Journal	Journal of Applied Physics
Volume	98
Issue number	1
DOIs	https://doi.org/10.1063/1.1943511
State	Published - Jul 1 2005

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.1943511

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@article{fe169e8d3a564809aff3228174b88895,

title = "Off-axis electron holography of pseudo-spin-valve thin-film magnetic elements",

abstract = "Magnetic remanent states in a rectangular array of 75×280- nm2 NiFeCuCo thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.",

author = "T. Kasama and P. Barpanda and Dunin-Borkowski, {R. E.} and Newcomb, {S. B.} and Martha McCartney and Casta{\~n}o, {F. J.} and Ross, {C. A.}",

note = "Funding Information: We acknowledge the Royal Society, UK, the National Science Foundation, USA, and TDK Corporation, Japan, for support, the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University for facilities, and B. V{\"o}geli and S. Haratani for sample preparation.",

year = "2005",

month = jul,

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doi = "10.1063/1.1943511",

language = "English (US)",

volume = "98",

journal = "Journal of Applied Physics",

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T1 - Off-axis electron holography of pseudo-spin-valve thin-film magnetic elements

AU - Kasama, T.

AU - Barpanda, P.

AU - Dunin-Borkowski, R. E.

AU - Newcomb, S. B.

AU - McCartney, Martha

AU - Castaño, F. J.

AU - Ross, C. A.

N1 - Funding Information: We acknowledge the Royal Society, UK, the National Science Foundation, USA, and TDK Corporation, Japan, for support, the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University for facilities, and B. Vögeli and S. Haratani for sample preparation.

PY - 2005/7/1

Y1 - 2005/7/1

N2 - Magnetic remanent states in a rectangular array of 75×280- nm2 NiFeCuCo thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

AB - Magnetic remanent states in a rectangular array of 75×280- nm2 NiFeCuCo thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

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Off-axis electron holography of pseudo-spin-valve thin-film magnetic elements

Abstract

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