Observation of sol-gel solid phase epitaxial growth of ferroelectric Pb(Nb,Zr,Ti)O3 thin films on sapphire

C. K. Barlingay, Sandwip Dey

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Abstract

This letter reports and discusses the observation of sol-gel solid phase epitaxy (SPE) of (110) Pb0.99Nb0.02(Zr 0.52Ti0.48)0.98O3 or PNZT(2/52/48) on 3 in. diam (011̄2) sapphire. The epitaxial nature (with at least single crystal-like texture) of these films was ascertained by HRTEM and x-ray diffraction studies, including pole figure analysis. Such PNZT thin films (0.6 μm) were transparent to wavelengths between 0.4 and 5.6 μm, and exhibited an optical band gap and a refractive index (at 0.6328 μm), of 3.6 eV and 2.5-2.6, respectively.

Original languageEnglish (US)
Pages (from-to)1278-1280
Number of pages3
JournalApplied Physics Letters
Volume61
Issue number11
DOIs
StatePublished - 1992

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epitaxy
solid phases
sapphire
x ray diffraction
poles
textures
gels
refractivity
single crystals
thin films
wavelengths

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Observation of sol-gel solid phase epitaxial growth of ferroelectric Pb(Nb,Zr,Ti)O3 thin films on sapphire. / Barlingay, C. K.; Dey, Sandwip.

In: Applied Physics Letters, Vol. 61, No. 11, 1992, p. 1278-1280.

Research output: Contribution to journalArticle

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