Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.
|Original language||English (US)|
|Journal||Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films|
|Publication status||Published - 2009|
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films