Nonsinusoidal buckling of thin gold films on elastomeric substrates

Huiyang Fei; Hanqing Jiang; Dahl Young Khang

doi:10.1116/1.3089244

Nonsinusoidal buckling of thin gold films on elastomeric substrates

Huiyang Fei, Hanqing Jiang, Dahl Young Khang

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.

Original language	English (US)
Pages (from-to)	L9-L13
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	27
Issue number	3
DOIs	https://doi.org/10.1116/1.3089244
State	Published - 2009

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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title = "Nonsinusoidal buckling of thin gold films on elastomeric substrates",

abstract = "Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.",

author = "Huiyang Fei and Hanqing Jiang and Khang, {Dahl Young}",

note = "Funding Information: H. Jiang acknowledges the support from the National Science Foundation under Grant No. DMI-0328162. D.-Y. Khang acknowledges financial support from the Yonsei University Research Fund of 2008, and “System IC 2010” project of Korea Ministry of Commerce, Industry and Economy.",

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AU - Fei, Huiyang

AU - Jiang, Hanqing

AU - Khang, Dahl Young

N1 - Funding Information: H. Jiang acknowledges the support from the National Science Foundation under Grant No. DMI-0328162. D.-Y. Khang acknowledges financial support from the Yonsei University Research Fund of 2008, and “System IC 2010” project of Korea Ministry of Commerce, Industry and Economy.

PY - 2009

Y1 - 2009

N2 - Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.

AB - Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.

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Nonsinusoidal buckling of thin gold films on elastomeric substrates

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