Noise analysis in magnetic resonance electrical impedance tomography at 3 and 11 T field strengths

Rosalind Sadleir, Samuel Grant, Uk Zhang Sung, Il Lee Byung, Chan Pyo Hyun, Hoon Oh Suk, Chunjae Park, Je Woo Eung, Yeol Lee Soo, Ohin Kwon, Keun Seo Jin

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