New ternary nitride in the Ti-Al-N system

Hee Dong Lee, William Petuskey

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The ternary compound Ti 3Al 1-xN 2 was found to be stable between ∼1523 and 1673 K and tended to be deficient in aluminum where 0.0 < x < 0.3. X-ray diffraction indicated that the ternary compound possessed a hexagonal structure with unit-cell dimensions of a 0 = 2.990 Å and c 0 = 23.3854 A. The existence of the compound "Ti 3Al 2N 2" that had been reported previously could not be confirmed for any experimental conditions at 1 atm pressure.

Original languageEnglish (US)
Pages (from-to)604-608
Number of pages5
JournalJournal of the American Ceramic Society
Volume80
Issue number3
StatePublished - 1997

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Aluminum
Nitrides
X ray diffraction

ASJC Scopus subject areas

  • Ceramics and Composites

Cite this

New ternary nitride in the Ti-Al-N system. / Lee, Hee Dong; Petuskey, William.

In: Journal of the American Ceramic Society, Vol. 80, No. 3, 1997, p. 604-608.

Research output: Contribution to journalArticle

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