Nanoscale compositional fluctuations in single InGaAs/GaAs quantum dots

M. De Giorgi, A. Passaseo, R. Rinaldi, T. Johal, R. Cingolani, A. Taurino, M. Catalano, Peter Crozier

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We report the first investigation of compositional disorder in quantum dots with subnanometer precision. We have investigated the compositional profile of a single InGaAs/GaAs quantum dot, of nominal In content x = 0.5, by using energy-dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM), and atomic force and scanning tunneling microscope (AFM-STM) topography. The compositional analysis at nanoscale reveals a number of unexpected features: (i) In enrichment of the centre of the dot (about 65% In content); (ii) In diffusion outside the dot contour; (iii) In depletion of the wetting layer in the surrounding of the dot.

Original languageEnglish (US)
Pages (from-to)17-20
Number of pages4
JournalPhysica Status Solidi (B) Basic Research
Volume224
Issue number1
DOIs
StatePublished - Mar 1 2001

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Nanoscale compositional fluctuations in single InGaAs/GaAs quantum dots'. Together they form a unique fingerprint.

Cite this