Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations

L. Zhao, H. Y. Chen, S. C. Wu, Z. Jiang, Shimeng Yu, T. H. Hou, H. S Philip Wong, Y. Nishi

Research output: Contribution to journalArticle

76 Citations (Scopus)

Abstract

Precise electrical manipulation of nanoscale defects such as vacancy nano-filaments is highly desired for the multi-level control of ReRAM. In this paper we present a systematic investigation on the pulse-train operation scheme for reliable multi-level control of conductive filament evolution. By applying the pulse-train scheme to a 3 bit per cell HfO2 ReRAM, the relative standard deviations of resistance levels are improved up to 80% compared to the single-pulse scheme. The observed exponential relationship between the saturated resistance and the pulse amplitude provides evidence for the gap-formation model of the filament-rupture process.

Original languageEnglish (US)
Pages (from-to)5698-5702
Number of pages5
JournalNanoscale
Volume6
Issue number11
DOIs
StatePublished - Jun 7 2014

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Level control
Vacancies
Defects
RRAM

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Zhao, L., Chen, H. Y., Wu, S. C., Jiang, Z., Yu, S., Hou, T. H., ... Nishi, Y. (2014). Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations. Nanoscale, 6(11), 5698-5702. https://doi.org/10.1039/c4nr00500g

Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations. / Zhao, L.; Chen, H. Y.; Wu, S. C.; Jiang, Z.; Yu, Shimeng; Hou, T. H.; Wong, H. S Philip; Nishi, Y.

In: Nanoscale, Vol. 6, No. 11, 07.06.2014, p. 5698-5702.

Research output: Contribution to journalArticle

Zhao, L, Chen, HY, Wu, SC, Jiang, Z, Yu, S, Hou, TH, Wong, HSP & Nishi, Y 2014, 'Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations', Nanoscale, vol. 6, no. 11, pp. 5698-5702. https://doi.org/10.1039/c4nr00500g
Zhao, L. ; Chen, H. Y. ; Wu, S. C. ; Jiang, Z. ; Yu, Shimeng ; Hou, T. H. ; Wong, H. S Philip ; Nishi, Y. / Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations. In: Nanoscale. 2014 ; Vol. 6, No. 11. pp. 5698-5702.
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