TY - GEN
T1 - MT-Diet
T2 - 14th IEEE International Conference on Pervasive Computing and Communications, PerCom 2016
AU - Lee, Junghyo
AU - Banerjee, Ayan
AU - Gupta, Sandeep
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/4/19
Y1 - 2016/4/19
N2 - In this paper, we propose MT-Diet, a smartphone-based automated diet monitoring system that interfaces a thermal camera with a smartphone and identifies types of food consumed at the click of a button. The system uses thermal maps of a food plate to increase accuracy of segmentation and extraction of food parts, and combines thermal and visual images to improve accuracy in the detection of cooked food. Test results on 80 different types of cooked food show that MT-Diet can isolate food parts with an accuracy of 97.5% and determine the type of food with an accuracy of 88.93%, which is a significant improvement (nearly 25%) over the state-of-the-art.
AB - In this paper, we propose MT-Diet, a smartphone-based automated diet monitoring system that interfaces a thermal camera with a smartphone and identifies types of food consumed at the click of a button. The system uses thermal maps of a food plate to increase accuracy of segmentation and extraction of food parts, and combines thermal and visual images to improve accuracy in the detection of cooked food. Test results on 80 different types of cooked food show that MT-Diet can isolate food parts with an accuracy of 97.5% and determine the type of food with an accuracy of 88.93%, which is a significant improvement (nearly 25%) over the state-of-the-art.
UR - http://www.scopus.com/inward/record.url?scp=84969135850&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84969135850&partnerID=8YFLogxK
U2 - 10.1109/PERCOM.2016.7456506
DO - 10.1109/PERCOM.2016.7456506
M3 - Conference contribution
AN - SCOPUS:84969135850
T3 - 2016 IEEE International Conference on Pervasive Computing and Communications, PerCom 2016
BT - 2016 IEEE International Conference on Pervasive Computing and Communications, PerCom 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 14 March 2016 through 19 March 2016
ER -