Abstract
Single layers of ZnSe, ZnS xSe 1-x and Zn 1-yMn yS xSe 1-x were grown on the GaAs(001). Real-time reflection high energy electron diffraction was used to study the initial growth of ZnSe(001) on GaAs(001) under different conditions. Exposure of the GaAs substrate to Se flux before growth led to three-dimensional growth, whereas exposure to Zn flux led to two dimensional-growth. ZnS xSe 1-x and Zn 1-yMn yS xSe 1-x (energy gap less than 2.9 eV) layers with the lattice constant closely matched to that of GaAs have been grown with a good reproducibility.
Original language | English (US) |
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Title of host publication | Materials Research Society Symposium - Proceedings |
Publisher | Materials Research Society |
Pages | 337-344 |
Number of pages | 8 |
Volume | 417 |
State | Published - 1996 |
Externally published | Yes |
Event | Proceedings of the 1995 MRS Fall Meeting - Boston, MA, USA Duration: Nov 27 1995 → Dec 1 1995 |
Other
Other | Proceedings of the 1995 MRS Fall Meeting |
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City | Boston, MA, USA |
Period | 11/27/95 → 12/1/95 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials