Abstract
The morphological evolution of tantalum surfaces induced by scanning in an electrochemical cell have been investigated by scanning tunneling microscopy (STM). Repeated scanning over the same region was found to create a surface with a reduced peak-to-peak corrugation. This phenomenon was observed for negative tip biases only, and was also found to occur at a slower rate while scanning in air. X-ray photoelectron spectroscopy shows layers of Ta2O5deposited anodically on samples imaged with STM.
Original language | English (US) |
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Pages (from-to) | 3537-3541 |
Number of pages | 5 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 8 |
Issue number | 4 |
DOIs | |
State | Published - Jul 1990 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films