Modeling and characterization of X-ray yield in a polychromatic, lab-scale, X-ray computed tomography system

J. C E Mertens, Nikhilesh Chawla

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Modeling and characterization of X-ray yield in a polychromatic, lab-scale, X-ray computed tomography system'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy