Microstructure representation and material characterization for multiscale finite element simulations of local mechanical behavior in damaged metallic structures

M. Parra Garcia, C. Luo, A. Noshadravan, A. Keck, R. Teale, Aditi Chattopadhyay, Pedro Peralta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Prediction of scatter on the mechanical behavior of metallic materials due to microstructural heterogeneity is important, particularly for damaged metallic structures, where degradation mechanisms such as fatigue can be very sensitive to microstructure variability, which is also a contributing factor to the scatter observed in the fatigue response of metallic materials. Two-dimensional (2D) and Three-dimensional (3D) representations of microstructures of 2xxx Al alloys are created via a combination of dual-scale serial sectioning techniques, with a smaller scale for particles and a larger scale for grains, Electron Backscattering Diffraction (EBSD) and available meshing and volume reconstruction software. In addition, "artificial" representations of the grains are also built from measurements of the crystallography and the geometry of the grains in representative cross sections of the samples. These measurements are then used to define a Representative Volume Element (RVE) with mechanical properties that are comparable to those in larger length scales, via simulations performed using finite element models of the RVE. In this work, the characteristics of the RVE are varied by introducing changes on either geometry, material properties or both and by "seeding" defects that represent damage (microcraks) or damage precursors (precipitates). Results indicate that models obtained predict the variability on stress fields expected at the local level, due to crystallographic and geometric variability of the microstructure.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6926
DOIs
StatePublished - 2008
EventModeling, Signal Processing, and Control for Smart Structures 2008 - San Diego, CA, United States
Duration: Mar 10 2008Mar 12 2008

Other

OtherModeling, Signal Processing, and Control for Smart Structures 2008
CountryUnited States
CitySan Diego, CA
Period3/10/083/12/08

Fingerprint

microstructure
Microstructure
Fatigue of materials
Crystallography
Geometry
simulation
Backscattering
damage
Precipitates
Materials properties
inoculation
geometry
Diffraction
stress distribution
crystallography
precipitates
Degradation
Mechanical properties
backscattering
Defects

Keywords

  • Aluminum
  • Defects
  • EBSD
  • Finite elements
  • Microstructure
  • Multiscale
  • RVE
  • Variability

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Garcia, M. P., Luo, C., Noshadravan, A., Keck, A., Teale, R., Chattopadhyay, A., & Peralta, P. (2008). Microstructure representation and material characterization for multiscale finite element simulations of local mechanical behavior in damaged metallic structures. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6926). [69260K] https://doi.org/10.1117/12.776580

Microstructure representation and material characterization for multiscale finite element simulations of local mechanical behavior in damaged metallic structures. / Garcia, M. Parra; Luo, C.; Noshadravan, A.; Keck, A.; Teale, R.; Chattopadhyay, Aditi; Peralta, Pedro.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6926 2008. 69260K.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Garcia, MP, Luo, C, Noshadravan, A, Keck, A, Teale, R, Chattopadhyay, A & Peralta, P 2008, Microstructure representation and material characterization for multiscale finite element simulations of local mechanical behavior in damaged metallic structures. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6926, 69260K, Modeling, Signal Processing, and Control for Smart Structures 2008, San Diego, CA, United States, 3/10/08. https://doi.org/10.1117/12.776580
Garcia MP, Luo C, Noshadravan A, Keck A, Teale R, Chattopadhyay A et al. Microstructure representation and material characterization for multiscale finite element simulations of local mechanical behavior in damaged metallic structures. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6926. 2008. 69260K https://doi.org/10.1117/12.776580
Garcia, M. Parra ; Luo, C. ; Noshadravan, A. ; Keck, A. ; Teale, R. ; Chattopadhyay, Aditi ; Peralta, Pedro. / Microstructure representation and material characterization for multiscale finite element simulations of local mechanical behavior in damaged metallic structures. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6926 2008.
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