Magnetic constrast in reflection electron microscopy

Z. L. Wang, John Spence

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

The possibility of obtaining magnetic contrast in reflection electron microscope images is considered. We consider the problem of observing two-dimensional magnetic domains in Fe monolayer films on a GaAs substrate. By introducing the vector potential into multiple scattering RHEED calculations based on the multi-slice algorithm, the effect of the Lorentz force on diffraction conditions is evaluated at the specular condition for 120 kV electrons. This provides a contrast mechanism. For Fe(110)/GaAs(110) the contrast which results in the (440) specular beam from a reversal of B normal to the beam in the plane of the surface is found to be about 28%, suggesting that useful contrast might be obtained from a single monolayer. The penetration depth of the wavefield into the crystal is studied as a function of incident beam direction The distance along the beam path needed to re-establish the steady-state condition following a reversal of B is used to estimate the resolution of the method. The method, which would allow real-time image recording at high sample temperatures, is compared briefly with other magnetically sensitive surface imaging techniques.

Original languageEnglish (US)
Pages (from-to)98-107
Number of pages10
JournalSurface Science
Volume234
Issue number1-2
DOIs
StatePublished - Aug 1 1990

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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