Magnetic constrast in reflection electron microscopy

Z. L. Wang, John Spence

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The possibility of obtaining magnetic contrast in reflection electron microscope images is considered. We consider the problem of observing two-dimensional magnetic domains in Fe monolayer films on a GaAs substrate. By introducing the vector potential into multiple scattering RHEED calculations based on the multi-slice algorithm, the effect of the Lorentz force on diffraction conditions is evaluated at the specular condition for 120 kV electrons. This provides a contrast mechanism. For Fe(110)/GaAs(110) the contrast which results in the (440) specular beam from a reversal of B normal to the beam in the plane of the surface is found to be about 28%, suggesting that useful contrast might be obtained from a single monolayer. The penetration depth of the wavefield into the crystal is studied as a function of incident beam direction The distance along the beam path needed to re-establish the steady-state condition following a reversal of B is used to estimate the resolution of the method. The method, which would allow real-time image recording at high sample temperatures, is compared briefly with other magnetically sensitive surface imaging techniques.

Original languageEnglish (US)
Pages (from-to)98-107
Number of pages10
JournalSurface Science
Volume234
Issue number1-2
DOIs
StatePublished - Aug 1 1990

Fingerprint

Electron microscopy
Monolayers
electron microscopy
Image recording
Lorentz force
Magnetic domains
Reflection high energy electron diffraction
Multiple scattering
Electron microscopes
Diffraction
Imaging techniques
Crystals
Electrons
Substrates
magnetic domains
imaging techniques
penetration
electron microscopes
recording
Temperature

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Magnetic constrast in reflection electron microscopy. / Wang, Z. L.; Spence, John.

In: Surface Science, Vol. 234, No. 1-2, 01.08.1990, p. 98-107.

Research output: Contribution to journalArticle

Wang, Z. L. ; Spence, John. / Magnetic constrast in reflection electron microscopy. In: Surface Science. 1990 ; Vol. 234, No. 1-2. pp. 98-107.
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